Want to hire this expert for a project? Request a quote for free.
Profile Details
Create Project
USD 10 /hr
Hire Dr. Omer A.
Pakistan
USD 10 /hr
PhD CS | Thesis Support: Methodology, Experiments, and Documentation
Profile Summary
Subject Matter Expertise
Services
Writing
Technical Writing
Research
Gap Analysis,
Scientific and Technical Research
Consulting
Scientific and Technical Consulting
Data & AI
Predictive Modeling,
Algorithm Design-Non ML,
Algorithm Design-ML,
Data Visualization,
Data Processing
Product Development
Formulation,
Manufacturing,
Concept Development,
Packaging Design,
Prototyping,
Reverse Engineering
Work Experience
The Islamia University of Bahawalpur Pakistan
November 2009 - Present ![]()
Software Engineer
Netsol Technologies Inc.
May 2008 - November 2009 ![]()
Education
Doctor of Philosophy
The Islamia University of Bahawalpur
October 2016 - September 2024
Certifications
- Certification details not provided.
Publications
JOURNAL ARTICLE
Omer Ajmal, Humaira Arshad, Muhammad Asad Arshed, Saeed Ahmed, Shahzad Mumtaz (2024). Robust Parameter Optimisation of Noise-Tolerant Clustering for DENCLUE Using Differential Evolution . Mathematics.
Omer Ajmal, Humaira Arshad, Muhammad Asad Arshed, Saeed Ahmed, Shahzad Mumtaz (2024). Robust Parameter Optimisation of Noise-Tolerant Clustering for DENCLUE Using Differential Evolution . Mathematics.
Omer Ajmal, Shahzad Mumtaz, Humaira Arshad, Abdullah Soomro, Tariq Hussain, Razaz Waheeb Attar, Ahmed Alhomoud (2024). Enhanced Parameter Estimation of DENsity CLUstEring (DENCLUE) Using Differential Evolution . Mathematics.
Omer Ajmal, Shahzad Mumtaz, Humaira Arshad, Abdullah Soomro, Tariq Hussain, Razaz Waheeb Attar, Ahmed Alhomoud (2024). Enhanced Parameter Estimation of DENsity CLUstEring (DENCLUE) Using Differential Evolution . Mathematics.
OTHER
Omer Ajmal, M. M. Saad Missen, Tazeen Hashmat, M. Moosa, Tenvir Ali(2013). EPlag: A two layer source code plagiarism detection system . Eighth International Conference on Digital Information Management (ICDIM 2013). {IEEE}